Surface analysis
It is important to quickly locate the cause of the problem during production disturbances. A combination of surface chemical analysis and microscopy are often powerful tools to find the source of the disturbance. Contact any of us for choosing the right analysis technology:
Do you already know the technology to be used, see contactpersons below:
ESCA
- Elemental composition at the coating-air surface.
- Vertical mapping of elemental composition using cross-sectioned (microtomed) coatings.
Contaktperson: Marie Ernstsson, marie.ernstsson@yki.se, +46 10 516 60 43
ToF-SIMS
- An extremely surface-sensitive instrument for detection of both elements and chemical compounds.
- Distribution of compounds on the surface, mapping, with a resolution of less than 1 micrometer.
Contactperson: Peter Sjövall, peter.sjovall@sp.se, +46 10 516 52 99
Light Microscopy
- Gives 2-dimensional images of surfaces (maximum 100x enlargement).
Contact person: Anders Larsson, anders.larsson@yki.se, +46 10 516 60 60
Profilometry
- Gives 3-dimensional images of surfaces. The vertical resolution is about 1 nm and the lateral resolution is about 1 micrometer. Maximum image size is 1 cm x 1 cm.
Contact person: Anders Larsson, anders.larsson@yki.se, +46 10 516 60 60
Electron Microscopy, ESEM-EDX, SEM-EDX
- Gives 2-dimensional images of surfaces, with very high resolution (maximum 50 000x enlargement).
- Point analysis of elemental composition can be conducted with the EDX detector.
- Plastic surfaces and coatings can be studied without sputtering with metals via the low-vacuum or ESEM mode.
Contact person: Anders Larsson, anders.larsson@yki.se, +46 10 516 60 60
AFM
- Gives 3-dimensional images of small areas (10 mm x 10 mm).
- Useful to characterise migration of low-molecular weight components to the surface.
Contact person: Anders Larsson, anders.larsson@surfchem.kth.se, +46 10 516 60 60
FT-IR
- With ATR (Attenuated Total Reflection) the analysis is limited to the outermost surface layer, a few micrometer thin, of a sample.
Contactperson: Kenneth Möller, kenneth.moller@sp.se, +46 10 516 51 88
UV-VIS-NIR
- Gives information on transmittance, absorbance and reflectance in the wavelengts of 200-2500 nanometer.
Contactperson: Kenneth Möller, kenneth.moller@sp.se, +46 10 516 51 88
ICP-MS
- With laser-ablation technique the elemental composition of surfaces can be analyzed with high sensitivity.
Contactperson: Conny Haraldsson, conny.haraldsson@sp.se, +46 10 516 56 65